Profilometer SJ5720-OPT
Profilometer for Optics Surface
SJ5720-OPT100 / 200
Description Key Features Software Application Specifications Video
Description
The SJ5720-OPT series is a highly capable metrology instrument designed for comprehensive surface analysis in both quality control laboratories and production floor environments. This advanced system performs simultaneous surface roughness measurement and profile scanning in a single pass, delivering efficient inspection workflow for manufacturing facilities.
Equipped with a dedicated aspheric surface analysis software module, this series provides precision measurement solutions specifically tailored for the optical lens industry. The system excels in contour measurement and surface topography analysis of complex geometries, making it ideal for R&D laboratories and optical manufacturing workshops.
SJ 5720-OPT100
Key Features
Simultaneous Profile and Roughness Evaluation
- Measure both profile and roughness parameters in a single scan.
- Saves time and increases efficiency.
Exceptional Precision Performance
- High measurement accuracy
- Outstanding stability
- Excellent repeatability
Specialized Aspheric Optical Software Module
- Dedicated solution for aspheric surfaces
- Comprehensive analysis of optical parameters
Intelligent Software System
Smart data management
Advanced analysis system
Integrated professional software
Safety and Protection
Intelligent protection system during scanning
Guaranteed operational safety
Mechanical Stability
High-stability vibration isolation system
Reduces external interference
SJ 5720-OPT200
Software
Professional Aspheric Surface Measurement Software
Complete analysis of all aspheric surface parameters
Built-in self-checking function
Automatic verification of input formula correctness
Intuitive interface with advanced management system
Application
Professional Aspheric Surface Measurement Software
Lens
Intraocular lens mold
Vehicle Lens
Infrared lens
Optical mold
Lens
Specifications SJ5720-OPT100
| Category | Parameter | Specification |
|---|---|---|
| General | Model No. | SJ5720-OPT100 |
| Contour Measurement | Measuring Range | |
| X | 0~100mm | |
| Z | 0~300mm | |
| Z1 | ±6mm (Optional: ±12mm) | |
| Resolution | 0.001μm | |
| Accuracy | ||
| Z1*1 | ≤±(0.5+0.03 H) μm (H, mm) | |
| Pt*2 | Pt≤0.2μm | |
| Standard Ball*3 | ≤±(1+R/20) μm (R, mm) | |
| Angle*4 | ≤±1' | |
| Moving Speed | ||
| X | 0~20mm/s | |
| Z | 0~20mm/s | |
| Scanning Speed | 0.05~5mm/s | |
| X Straightness*5 | ≤0.15μm/100mm | |
| Measuring Force | 0.5mN, 0.75mN, 1mN, 2mN, 3mN (Adjustable) | |
| Roughness Measurement | Ra Measurement Range | Ra0.012μm~Ra12.5μm (Large range is optional) |
| Accuracy*6 |
Ra0.012μm ~ Ra3.2μm: ≤±(3nm+2.0%A), A(Ra)μm Ra3.201μm ~ Ra12.5μm: ≤±(3nm+3.5%A), A(Ra)μm |
|
| Repeatability (1sig)*7 | 1sig≤1nm | |
| Measurement Residual*8 | Rq≤3nm | |
| Roughness Parameters |
R roughness: Rp, Rv, Rz, Rc, Rt, Ra, Rd, Rsk, Rku, RSm, RPc, Rdq, Rdc, Rmr, Rmax, Rpm, tp, Htp, Pc, Rda, Ry, Sm, S, Rpq, Rvq, Rmo, RzJ, Rv1max, Rp1max, Rz1max, Rmr(Rz/4), maxRa, R5z, R3z, Rh, Dq, Lq, SD Key roughness: Rcore: Rk, Rpk, Rvk, Mr1, Mr2, A1, A2 Profile: Pa, Pq, Pt, Pz, Pp, PV, PSm, Psk, Pku, Pdq, Pdc, Pc, PPc, Pvq, Pmr, Pmq, Rad, PzJ, Pmax, StpHt, TIR, Avg, Slope, Area+, Area-, Area, Profi, Edge, Stpwd, Bumpht Waviness of profile: Wa, Wq, Wt, Wz, Wp, Wv, WSm, Wsk, Wku, Wdq, Wdc, Wmr, Wpc, Wc, Wh, Wmr(WZ/4) Motif: R, AR, W, AW, Rx, Wx, Wte, Nr, NCrx, NW, Cpm, CR, CF, CL ISO5436: Pt5436, D |
|
| Aspheric Measurement | Aspheric Measurement Parameters |
Micro profile parameters: Pt, Pa, Fig; inclination parameters: Smx, Smn; Horizontal axis angle parameter: Tilt; Distance parameters between the optical axis and the contour: Xp, XV, Xt; Root mean square roughness parameter: RMS; Slope parameters: Slpe mx, Sjpermx (x), Sjperms, Slpe are; Vertex radius error parameter: Radius Err |
| Filter | Filter Types | Gaussian filter, 2RC filter, zero phase filter |
| Sampling | Sampling Length | 0.008, 0.08, 0.25, 0.8, 2.5, 8.0 or 25mm Selectable |
| Evaluation Length | Auto calculation | |
| Physical Specifications | Size (L×W×H) | 600×350×890mm |
| Weight | tt |
Notes:
- *1 The accuracy is based on the measurement standard gauge block.
- *2 The accuracy is based on the Pt test of standard ball smaller than diameter 25mm.
- *3 The accuracy is based on the verification of the Φ 50mm standard ball with the arc exceeds 90 degrees.
- *4 The accuracy is based on the measurement of the angle of polygonal prism.
- *5 The accuracy is based on the measurement of optical flat.
- *6 The accuracy is based on the measurement of standard roughness block.
- *7 The repeatability is based on the measurement of 0.1-0.2μm square wave roughness block and standard step height block.
- *8 The accuracy is based on the measurement of 1nm level roughness block and optical flat.
Specifications SJ5720-OPT100
| Category | Parameter | Specification |
|---|---|---|
| General | Model No. | SJ5720-OPT100 |
| Contour Measurement | Measuring Range | |
| X | 0~100mm | |
| Z | 0~300mm | |
| Z1 | ±6mm (Optional: ±12mm) | |
| Resolution | 0.001μm | |
| Accuracy | ||
| Z1*1 | ≤±(0.5+0.03 H) μm (H, mm) | |
| Pt*2 | Pt≤0.2μm | |
| Standard Ball*3 | ≤±(1+R/20) μm (R, mm) | |
| Angle*4 | ≤±1' | |
| Moving Speed | ||
| X | 0~20mm/s | |
| Z | 0~20mm/s | |
| Scanning Speed | 0.05~5mm/s | |
| X Straightness*5 | ≤0.15μm/100mm | |
| Measuring Force | 0.5mN, 0.75mN, 1mN, 2mN, 3mN (Adjustable) | |
| Roughness Measurement | Ra Measurement Range | Ra0.012μm~Ra12.5μm (Large range is optional) |
| Accuracy*6 |
Ra0.012μm ~ Ra3.2μm: ≤±(3nm+2.0%A), A(Ra)μm Ra3.201μm ~ Ra12.5μm: ≤±(3nm+3.5%A), A(Ra)μm |
|
| Repeatability (1sig)*7 | 1sig≤1nm | |
| Measurement Residual*8 | Rq≤3nm | |
| Roughness Parameters |
R roughness: Rp, Rv, Rz, Rc, Rt, Ra, Rd, Rsk, Rku, RSm, RPc, Rdq, Rdc, Rmr, Rmax, Rpm, tp, Htp, Pc, Rda, Ry, Sm, S, Rpq, Rvq, Rmo, RzJ, Rv1max, Rp1max, Rz1max, Rmr(Rz/4), maxRa, R5z, R3z, Rh, Dq, Lq, SD Key roughness: Rcore: Rk, Rpk, Rvk, Mr1, Mr2, A1, A2 Profile: Pa, Pq, Pt, Pz, Pp, PV, PSm, Psk, Pku, Pdq, Pdc, Pc, PPc, Pvq, Pmr, Pmq, Rad, PzJ, Pmax, StpHt, TIR, Avg, Slope, Area+, Area-, Area, Profi, Edge, Stpwd, Bumpht Waviness of profile: Wa, Wq, Wt, Wz, Wp, Wv, WSm, Wsk, Wku, Wdq, Wdc, Wmr, Wpc, Wc, Wh, Wmr(WZ/4) Motif: R, AR, W, AW, Rx, Wx, Wte, Nr, NCrx, NW, Cpm, CR, CF, CL ISO5436: Pt5436, D |
|
| Aspheric Measurement | Aspheric Measurement Parameters |
Micro profile parameters: Pt, Pa, Fig; inclination parameters: Smx, Smn; Horizontal axis angle parameter: Tilt; Distance parameters between the optical axis and the contour: Xp, XV, Xt; Root mean square roughness parameter: RMS; Slope parameters: Slpe mx, Sjpermx (x), Sjperms, Slpe are; Vertex radius error parameter: Radius Err |
| Filter | Filter Types | Gaussian filter, 2RC filter, zero phase filter |
| Sampling | Sampling Length | 0.008, 0.08, 0.25, 0.8, 2.5, 8.0 or 25mm Selectable |
| Evaluation Length | Auto calculation | |
| Physical Specifications | Size (L×W×H) | 600×350×890mm |
| Weight | tt |
Notes:
- *1 The accuracy is based on the measurement standard gauge block.
- *2 The accuracy is based on the Pt test of standard ball smaller than diameter 25mm.
- *3 The accuracy is based on the verification of the Φ 50mm standard ball with the arc exceeds 90 degrees.
- *4 The accuracy is based on the measurement of the angle of polygonal prism.
- *5 The accuracy is based on the measurement of optical flat.
- *6 The accuracy is based on the measurement of standard roughness block.
- *7 The repeatability is based on the measurement of 0.1-0.2μm square wave roughness block and standard step height block.
- *8 The accuracy is based on the measurement of 1nm level roughness block and optical flat.
Specifications SJ5720-OPT200
| Category | Parameter | Specification |
|---|---|---|
| General | Model No. | SJ5720-OPT200 |
| Contour Measurement | Measuring Range | |
| X | 0~200mm | |
| Z | 0~500mm | |
| Z1 | ±6mm (Optional: ±12mm) | |
| Resolution | 0.001μm | |
| Accuracy | ||
| Z1*1 | ≤±(0.5+0.03 H) μm (H, mm) | |
| Pt*2 | Pt≤0.2μm | |
| Standard Ball*3 | ≤±(1+R/20) μm (R, mm) | |
| Angle*4 | ≤±1' | |
| Moving Speed | ||
| X | 0~20mm/s | |
| Z | 0~20mm/s | |
| Scanning Speed | 0.05~5mm/s | |
| X Straightness*5 | ≤0.15μm/100mm | |
| Measuring Force | 0.5mN, 0.75mN, 1mN, 2mN, 3mN (Adjustable) | |
| Roughness Measurement | Ra Measurement Range | Ra0.012μm~Ra12.5μm (Large range is optional) |
| Accuracy*6 |
Ra0.012μm ~ Ra3.2μm: ≤±(3nm+2.0%A), A(Ra)μm Ra3.201μm ~ Ra12.5μm: ≤±(3nm+3.5%A), A(Ra)μm |
|
| Repeatability (1sig)*7 | 1sig≤1nm | |
| Measurement Residual*8 | Rq≤3nm | |
| Roughness Parameters |
R roughness: Rp, Rv, Rz, Rc, Rt, Ra, Rd, Rsk, Rku, RSm, RPc, Rdq, Rdc, Rmr, Rmax, Rpm, tp, Htp, Pc, Rda, Ry, Sm, S, Rpq, Rvq, Rmo, RzJ, Rv1max, Rp1max, Rz1max, Rmr(Rz/4), maxRa, R5z, R3z, Rh, Dq, Lq, SD Key roughness: Rcore: Rk, Rpk, Rvk, Mr1, Mr2, A1, A2 Profile: Pa, Pq, Pt, Pz, Pp, PV, PSm, Psk, Pku, Pdq, Pdc, Pc, PPc, Pvq, Pmr, Pmq, Rad, PzJ, Pmax, StpHt, TIR, Avg, Slope, Area+, Area-, Area, Profi, Edge, Stpwd, Bumpht Waviness of profile: Wa, Wq, Wt, Wz, Wp, Wv, WSm, Wsk, Wku, Wdq, Wdc, Wmr, Wpc, Wc, Wh, Wmr(WZ/4) Motif: R, AR, W, AW, Rx, Wx, Wte, Nr, NCrx, NW, Cpm, CR, CF, CL ISO5436: Pt5436, D |
|
| Aspheric Measurement | Aspheric Measurement Parameters |
Micro profile parameters: Pt, Pa, Fig; inclination parameters: Smx, Smn; Horizontal axis angle parameter: Tilt; Distance parameters between the optical axis and the contour: Xp, XV, Xt; Root mean square roughness parameter: RMS; Slope parameters: Slpe mx, Sjpermx (x), Sjperms, Slpe are; Vertex radius error parameter: Radius Err |
| Filter | Filter Types | Gaussian filter, 2RC filter, zero phase filter |
| Sampling | Sampling Length | 0.008, 0.08, 0.25, 0.8, 2.5, 8.0 or 25mm Selectable |
| Evaluation Length | Auto calculation | |
| Physical Specifications | Size (L×W×H) | 800×500×1080mm |
| Weight | 265kg |
Notes:
- *1 The accuracy is based on the measurement standard gauge block.
- *2 The accuracy is based on the Pt test of standard ball smaller than diameter 25mm.
- *3 The accuracy is based on the verification of the Φ 50mm standard ball with the arc exceeds 90 degrees.
- *4 The accuracy is based on the measurement of the angle of polygonal prism.
- *5 The accuracy is based on the measurement of optical flat.
- *6 The accuracy is based on the measurement of standard roughness block.
- *7 The repeatability is based on the measurement of 0.1-0.2μm square wave roughness block and standard step height block.
- *8 The accuracy is based on the measurement of 1nm level roughness block and optical flat.
Specifications SJ5720-OPT200
| Category | Parameter | Specification |
|---|---|---|
| General | Model No. | SJ5720-OPT200 |
| Contour Measurement | Measuring Range | |
| X | 0~200mm | |
| Z | 0~500mm | |
| Z1 | ±6mm (Optional: ±12mm) | |
| Resolution | 0.001μm | |
| Accuracy | ||
| Z1*1 | ≤±(0.5+0.03 H) μm (H, mm) | |
| Pt*2 | Pt≤0.2μm | |
| Standard Ball*3 | ≤±(1+R/20) μm (R, mm) | |
| Angle*4 | ≤±1' | |
| Moving Speed | ||
| X | 0~20mm/s | |
| Z | 0~20mm/s | |
| Scanning Speed | 0.05~5mm/s | |
| X Straightness*5 | ≤0.15μm/100mm | |
| Measuring Force | 0.5mN, 0.75mN, 1mN, 2mN, 3mN (Adjustable) | |
| Roughness Measurement | Ra Measurement Range | Ra0.012μm~Ra12.5μm (Large range is optional) |
| Accuracy*6 |
Ra0.012μm ~ Ra3.2μm: ≤±(3nm+2.0%A), A(Ra)μm Ra3.201μm ~ Ra12.5μm: ≤±(3nm+3.5%A), A(Ra)μm |
|
| Repeatability (1sig)*7 | 1sig≤1nm | |
| Measurement Residual*8 | Rq≤3nm | |
| Roughness Parameters |
R roughness: Rp, Rv, Rz, Rc, Rt, Ra, Rd, Rsk, Rku, RSm, RPc, Rdq, Rdc, Rmr, Rmax, Rpm, tp, Htp, Pc, Rda, Ry, Sm, S, Rpq, Rvq, Rmo, RzJ, Rv1max, Rp1max, Rz1max, Rmr(Rz/4), maxRa, R5z, R3z, Rh, Dq, Lq, SD Key roughness: Rcore: Rk, Rpk, Rvk, Mr1, Mr2, A1, A2 Profile: Pa, Pq, Pt, Pz, Pp, PV, PSm, Psk, Pku, Pdq, Pdc, Pc, PPc, Pvq, Pmr, Pmq, Rad, PzJ, Pmax, StpHt, TIR, Avg, Slope, Area+, Area-, Area, Profi, Edge, Stpwd, Bumpht Waviness of profile: Wa, Wq, Wt, Wz, Wp, Wv, WSm, Wsk, Wku, Wdq, Wdc, Wmr, Wpc, Wc, Wh, Wmr(WZ/4) Motif: R, AR, W, AW, Rx, Wx, Wte, Nr, NCrx, NW, Cpm, CR, CF, CL ISO5436: Pt5436, D |
|
| Aspheric Measurement | Aspheric Measurement Parameters |
Micro profile parameters: Pt, Pa, Fig; inclination parameters: Smx, Smn; Horizontal axis angle parameter: Tilt; Distance parameters between the optical axis and the contour: Xp, XV, Xt; Root mean square roughness parameter: RMS; Slope parameters: Slpe mx, Sjpermx (x), Sjperms, Slpe are; Vertex radius error parameter: Radius Err |
| Filter | Filter Types | Gaussian filter, 2RC filter, zero phase filter |
| Sampling | Sampling Length | 0.008, 0.08, 0.25, 0.8, 2.5, 8.0 or 25mm Selectable |
| Evaluation Length | Auto calculation | |
| Physical Specifications | Size (L×W×H) | 800×500×1080mm |
| Weight | 265kg |
Notes:
- *1 The accuracy is based on the measurement standard gauge block.
- *2 The accuracy is based on the Pt test of standard ball smaller than diameter 25mm.
- *3 The accuracy is based on the verification of the Φ 50mm standard ball with the arc exceeds 90 degrees.
- *4 The accuracy is based on the measurement of the angle of polygonal prism.
- *5 The accuracy is based on the measurement of optical flat.
- *6 The accuracy is based on the measurement of standard roughness block.
- *7 The repeatability is based on the measurement of 0.1-0.2μm square wave roughness block and standard step height block.
- *8 The accuracy is based on the measurement of 1nm level roughness block and optical flat.
Video
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Introduction and Application of Profilometer SJ5700 Series
Chotest Profilometer for Optics Surface SJ5720-OPT200
Chotest Profilometer for Optics Surface SJ5720-OPT200
Contour & Roughness in one solution