Profilometer SJ5720-OPT
Profilomètre pour surfaces optiques
SJ5720-OPT100 / 200
Description Caractéristiques principales Software Applications Specifications Video
Description
La série SJ5720-OPT est un instrument de métrologie hautement performant, conçu pour une analyse complète des surfaces, aussi bien dans les laboratoires de contrôle qualité que dans les environnements de production. Ce système avancé réalise simultanément la mesure de la rugosité de surface et le balayage du profil en un seul passage, offrant un flux d’inspection efficace pour les sites de fabrication.
Équipée d’un module logiciel dédié à l’analyse des surfaces asphériques, cette série offre des solutions de mesure de précision spécialement conçues pour l’industrie des lentilles optiques. Le système excelle dans la mesure de contour et l’analyse de la topographie de surface de géométries complexes, ce qui le rend idéal pour les laboratoires de R&D et les ateliers de fabrication optique.
SJ 5720-OPT100
Caractéristiques principales
Évaluation simultanée du profil et de la rugosité
- Mesure à la fois les paramètres de profil et de rugosité en un seul balayage.
- Gagne du temps et augmente l’efficacité.
Performance de précision exceptionnelle
- Haute précision de mesure
- Stabilité remarquable
- Excellente répétabilité
Module logiciel spécialisé pour l’optique asphérique
- Solution dédiée aux surfaces asphériques
- Analyse complète des paramètres optiques
Système logiciel intelligent
Gestion intelligente des données
Système d’analyse avancé
Logiciel professionnel intégré
Sécurité et protection
Système de protection intelligent pendant le balayage
Sécurité opérationnelle garantie
Stabilité mécanique
Système d’isolation contre les vibrations à haute stabilité
Réduit les interférences externes
SJ 5720-OPT200
Logiciel
Logiciel professionnel de mesure de surface asphérique
Analyse complète de tous les paramètres de surface asphérique
Fonction d’auto-vérification intégrée
Vérification automatique de la validité des formules saisies
Interface intuitive avec système de gestion avancé
Application
Logiciel professionnel de mesure de surface asphérique
Lentilles
Moule de lentille intraoculaire
Lentille pour véhicule
Lentille Infrarouge
Moule d'optique
Lentilles
Specifications SJ5720-OPT100
| Category | Parameter | Specification |
|---|---|---|
| General | Model No. | SJ5720-OPT100 |
| Contour Measurement | Measuring Range | |
| X | 0~100mm | |
| Z | 0~300mm | |
| Z1 | ±6mm (Optional: ±12mm) | |
| Resolution | 0.001μm | |
| Accuracy | ||
| Z1*1 | ≤±(0.5+0.03 H) μm (H, mm) | |
| Pt*2 | Pt≤0.2μm | |
| Standard Ball*3 | ≤±(1+R/20) μm (R, mm) | |
| Angle*4 | ≤±1' | |
| Moving Speed | ||
| X | 0~20mm/s | |
| Z | 0~20mm/s | |
| Scanning Speed | 0.05~5mm/s | |
| X Straightness*5 | ≤0.15μm/100mm | |
| Measuring Force | 0.5mN, 0.75mN, 1mN, 2mN, 3mN (Adjustable) | |
| Roughness Measurement | Ra Measurement Range | Ra0.012μm~Ra12.5μm (Large range is optional) |
| Accuracy*6 |
Ra0.012μm ~ Ra3.2μm: ≤±(3nm+2.0%A), A(Ra)μm Ra3.201μm ~ Ra12.5μm: ≤±(3nm+3.5%A), A(Ra)μm |
|
| Repeatability (1sig)*7 | 1sig≤1nm | |
| Measurement Residual*8 | Rq≤3nm | |
| Roughness Parameters |
R roughness: Rp, Rv, Rz, Rc, Rt, Ra, Rd, Rsk, Rku, RSm, RPc, Rda, Rdc, Rmr, Rmax, Rpm, tp, Htp, Pc, Rda, Ry, Sm, S, Rpd, Rvq, Rmq, RzJ, Rv1max, Rp1max, Rz1max, Rmr(Rz/4), maxRa, RSz, R3z, Rh, Dq, Lq, SD
Key roughness: Rcore: Rk, Rpk, Rvk, Mr1, Mr2, A1, A2 Profile: Pa, Pq, Pt, Pz, Pp, Pv, PSm, Psk, Pku, Pdq, Pdc, Pc, PPc, Pvq, Pmr, Pmq, Rad, PzJ, Pmax, StpHt, TIR, Avg, Slope, Area+, Area-, Area, Profi, Edge, StpWd, Bumpht Waviness of profile: Wa, Wq, Wt, Wz, Wp, Wv, WSm, Wsk, Wku, Wdq, Wdc, Wmr, Wpc, Wc, Wh, Wmr(WZ/4) Motif: R, AR, W, AW, Rx, Wx, Wie, Nr, Ncrx, Nw, Cpm, CR, CF, CL ISO5436: PI5436, D |
|
| Aspheric Measurement | Aspheric Measurement Parameters |
Micro profile parameters: Pt, Pa, Fig; inclination parameters: Smx, Smn; Horizontal axis angle parameter: Tilt; Distance parameters between the optical axis and the contour: Xp, XV, Xt; Root mean square roughness parameter: RMS; Slope parameters: Slpe mx, Sjpermx (x), Sjperms, Slpe are; Vertex radius error parameter: Radius Err |
| Filter | Filter Types | Gaussian filter, 2RC filter, zero phase filter |
| Sampling | Sampling Length | 0.008, 0.08, 0.25, 0.8, 2.5, 8.0, 25mm selectable |
| Evaluation Length | Auto calculation | |
| Physical Specifications | Size (L×W×H) | 600×350×890mm |
| Weight | tt |
Notes:
- *1 The accuracy is based on the measurement standard gauge block.
- *2 The accuracy is based on the Pt test of standard ball smaller than diameter 25mm.
- *3 The accuracy is based on the verification of the Φ 50mm standard ball with the arc exceeds 90 degrees.
- *4 The accuracy is based on the measurement of the angle of polygonal prism.
- *5 The accuracy is based on the measurement of optical flat.
- *6 The accuracy is based on the measurement of standard roughness block.
- *7 The repeatability is based on the measurement of 0.1-0.2μm square wave roughness block and standard step height block.
- *8 The accuracy is based on the measurement of 1nm level roughness block and optical flat.
Specifications SJ5720-OPT100
| Category | Parameter | Specification |
|---|---|---|
| General | Model No. | SJ5720-OPT100 |
| Contour Measurement | Measuring Range | |
| X | 0~100mm | |
| Z | 0~300mm | |
| Z1 | ±6mm (Optional: ±12mm) | |
| Resolution | 0.001μm | |
| Accuracy | ||
| Z1*1 | ≤±(0.5+0.03 H) μm (H, mm) | |
| Pt*2 | Pt≤0.2μm | |
| Standard Ball*3 | ≤±(1+R/20) μm (R, mm) | |
| Angle*4 | ≤±1' | |
| Moving Speed | ||
| X | 0~20mm/s | |
| Z | 0~20mm/s | |
| Scanning Speed | 0.05~5mm/s | |
| X Straightness*5 | ≤0.15μm/100mm | |
| Measuring Force | 0.5mN, 0.75mN, 1mN, 2mN, 3mN (Adjustable) | |
| Roughness Measurement | Ra Measurement Range | Ra0.012μm~Ra12.5μm (Large range is optional) |
| Accuracy*6 |
Ra0.012μm ~ Ra3.2μm: ≤±(3nm+2.0%A), A(Ra)μm Ra3.201μm ~ Ra12.5μm: ≤±(3nm+3.5%A), A(Ra)μm |
|
| Repeatability (1sig)*7 | 1sig≤1nm | |
| Measurement Residual*8 | Rq≤3nm | |
| Roughness Parameters |
R roughness: Rp, Rv, Rz, Rc, Rt, Ra, Rd, Rsk, Rku, RSm, RPc, Rda, Rdc, Rmr, Rmax, Rpm, tp, Htp, Pc, Rda, Ry, Sm, S, Rpd, Rvq, Rmq, RzJ, Rv1max, Rp1max, Rz1max, Rmr(Rz/4), maxRa, RSz, R3z, Rh, Dq, Lq, SD
Key roughness: Rcore: Rk, Rpk, Rvk, Mr1, Mr2, A1, A2 Profile: Pa, Pq, Pt, Pz, Pp, Pv, PSm, Psk, Pku, Pdq, Pdc, Pc, PPc, Pvq, Pmr, Pmq, Rad, PzJ, Pmax, StpHt, TIR, Avg, Slope, Area+, Area-, Area, Profi, Edge, StpWd, Bumpht Waviness of profile: Wa, Wq, Wt, Wz, Wp, Wv, WSm, Wsk, Wku, Wdq, Wdc, Wmr, Wpc, Wc, Wh, Wmr(WZ/4) Motif: R, AR, W, AW, Rx, Wx, Wie, Nr, Ncrx, Nw, Cpm, CR, CF, CL ISO5436: PI5436, D |
|
| Aspheric Measurement | Aspheric Measurement Parameters |
Micro profile parameters: Pt, Pa, Fig; inclination parameters: Smx, Smn; Horizontal axis angle parameter: Tilt; Distance parameters between the optical axis and the contour: Xp, XV, Xt; Root mean square roughness parameter: RMS; Slope parameters: Slpe mx, Sjpermx (x), Sjperms, Slpe are; Vertex radius error parameter: Radius Err |
| Filter | Filter Types | Gaussian filter, 2RC filter, zero phase filter |
| Sampling | Sampling Length | 0.008, 0.08, 0.25, 0.8, 2.5, 8.0, 25mm selectable |
| Evaluation Length | Auto calculation | |
| Physical Specifications | Size (L×W×H) | 600×350×890mm |
| Weight | tt |
Notes:
- *1 The accuracy is based on the measurement standard gauge block.
- *2 The accuracy is based on the Pt test of standard ball smaller than diameter 25mm.
- *3 The accuracy is based on the verification of the Φ 50mm standard ball with the arc exceeds 90 degrees.
- *4 The accuracy is based on the measurement of the angle of polygonal prism.
- *5 The accuracy is based on the measurement of optical flat.
- *6 The accuracy is based on the measurement of standard roughness block.
- *7 The repeatability is based on the measurement of 0.1-0.2μm square wave roughness block and standard step height block.
- *8 The accuracy is based on the measurement of 1nm level roughness block and optical flat.
Specifications SJ5720-OPT200
| Category | Parameter | Specification |
|---|---|---|
| General | Model No. | SJ5720-OPT200 |
| Contour Measurement | Measuring Range | |
| X | 0~200mm | |
| Z | 0~500mm | |
| Z1 | ±6mm (Optional: ±12mm) | |
| Resolution | 0.001μm | |
| Accuracy | ||
| Z1*1 | ≤±(0.5+0.03 H) μm (H, mm) | |
| Pt*2 | Pt≤0.2μm | |
| Standard Ball*3 | ≤±(1+R/20) μm (R, mm) | |
| Angle*4 | ≤±1' | |
| Moving Speed | ||
| X | 0~20mm/s | |
| Z | 0~20mm/s | |
| Scanning Speed | 0.05~5mm/s | |
| X Straightness*5 | ≤0.15μm/100mm | |
| Measuring Force | 0.5mN, 0.75mN, 1mN, 2mN, 3mN (Adjustable) | |
| Roughness Measurement | Ra Measurement Range | Ra0.012μm~Ra12.5μm (Large range is optional) |
| Accuracy*6 |
Ra0.012μm ~ Ra3.2μm: ≤±(3nm+2.0%A), A(Ra)μm Ra3.201μm ~ Ra12.5μm: ≤±(3nm+3.5%A), A(Ra)μm |
|
| Repeatability (1sig)*7 | 1sig≤1nm | |
| Measurement Residual*8 | Rq≤3nm | |
| Roughness Parameters |
R roughness: Rp, Rv, Rz, Rc, Rt, Ra, Rd, Rsk, Rku, RSm, RPc, Rda, Rdc, Rmr, Rmax, Rpm, tp, Htp, Pc, Rda, Ry, Sm, S, Rpd, Rvq, Rmq, RzJ, Rv1max, Rp1max, Rz1max, Rmr(Rz/4), maxRa, RSz, R3z, Rh, Dq, Lq, SD
Key roughness: Rcore: Rk, Rpk, Rvk, Mr1, Mr2, A1, A2 Profile: Pa, Pq, Pt, Pz, Pp, Pv, PSm, Psk, Pku, Pdq, Pdc, Pc, PPc, Pvq, Pmr, Pmq, Rad, PzJ, Pmax, StpHt, TIR, Avg, Slope, Area+, Area-, Area, Profi, Edge, StpWd, Bumpht Waviness of profile: Wa, Wq, Wt, Wz, Wp, Wv, WSm, Wsk, Wku, Wdq, Wdc, Wmr, Wpc, Wc, Wh, Wmr(WZ/4) Motif: R, AR, W, AW, Rx, Wx, Wie, Nr, Ncrx, Nw, Cpm, CR, CF, CL ISO5436: PI5436, D |
|
| Aspheric Measurement | Aspheric Measurement Parameters |
Micro profile parameters: Pt, Pa, Fig; inclination parameters: Smx, Smn; Horizontal axis angle parameter: Tilt; Distance parameters between the optical axis and the contour: Xp, XV, Xt; Root mean square roughness parameter: RMS; Slope parameters: Slpe mx, Sjpermx (x), Sjperms, Slpe are; Vertex radius error parameter: Radius Err |
| Filter | Filter Types | Gaussian filter, 2RC filter, zero phase filter |
| Sampling | Sampling Length | 0.008, 0.08, 0.25, 0.8, 2.5, 8.0, 25mm selectable |
| Evaluation Length | Auto calculation | |
| Physical Specifications | Size (L×W×H) | 800×500×1080mm |
| Weight | 265kg |
Notes:
- *1 The accuracy is based on the measurement standard gauge block.
- *2 The accuracy is based on the Pt test of standard ball smaller than diameter 25mm.
- *3 The accuracy is based on the verification of the Φ 50mm standard ball with the arc exceeds 90 degrees.
- *4 The accuracy is based on the measurement of the angle of polygonal prism.
- *5 The accuracy is based on the measurement of optical flat.
- *6 The accuracy is based on the measurement of standard roughness block.
- *7 The repeatability is based on the measurement of 0.1-0.2μm square wave roughness block and standard step height block.
- *8 The accuracy is based on the measurement of 1nm level roughness block and optical flat.
Specifications SJ5720-OPT200
| Category | Parameter | Specification |
|---|---|---|
| General | Model No. | SJ5720-OPT200 |
| Contour Measurement | Measuring Range | |
| X | 0~200mm | |
| Z | 0~500mm | |
| Z1 | ±6mm (Optional: ±12mm) | |
| Resolution | 0.001μm | |
| Accuracy | ||
| Z1*1 | ≤±(0.5+0.03 H) μm (H, mm) | |
| Pt*2 | Pt≤0.2μm | |
| Standard Ball*3 | ≤±(1+R/20) μm (R, mm) | |
| Angle*4 | ≤±1' | |
| Moving Speed | ||
| X | 0~20mm/s | |
| Z | 0~20mm/s | |
| Scanning Speed | 0.05~5mm/s | |
| X Straightness*5 | ≤0.15μm/100mm | |
| Measuring Force | 0.5mN, 0.75mN, 1mN, 2mN, 3mN (Adjustable) | |
| Roughness Measurement | Ra Measurement Range | Ra0.012μm~Ra12.5μm (Large range is optional) |
| Accuracy*6 |
Ra0.012μm ~ Ra3.2μm: ≤±(3nm+2.0%A), A(Ra)μm Ra3.201μm ~ Ra12.5μm: ≤±(3nm+3.5%A), A(Ra)μm |
|
| Repeatability (1sig)*7 | 1sig≤1nm | |
| Measurement Residual*8 | Rq≤3nm | |
| Roughness Parameters |
R roughness: Rp, Rv, Rz, Rc, Rt, Ra, Rd, Rsk, Rku, RSm, RPc, Rda, Rdc, Rmr, Rmax, Rpm, tp, Htp, Pc, Rda, Ry, Sm, S, Rpd, Rvq, Rmq, RzJ, Rv1max, Rp1max, Rz1max, Rmr(Rz/4), maxRa, RSz, R3z, Rh, Dq, Lq, SD
Key roughness: Rcore: Rk, Rpk, Rvk, Mr1, Mr2, A1, A2 Profile: Pa, Pq, Pt, Pz, Pp, Pv, PSm, Psk, Pku, Pdq, Pdc, Pc, PPc, Pvq, Pmr, Pmq, Rad, PzJ, Pmax, StpHt, TIR, Avg, Slope, Area+, Area-, Area, Profi, Edge, StpWd, Bumpht Waviness of profile: Wa, Wq, Wt, Wz, Wp, Wv, WSm, Wsk, Wku, Wdq, Wdc, Wmr, Wpc, Wc, Wh, Wmr(WZ/4) Motif: R, AR, W, AW, Rx, Wx, Wie, Nr, Ncrx, Nw, Cpm, CR, CF, CL ISO5436: PI5436, D |
|
| Aspheric Measurement | Aspheric Measurement Parameters |
Micro profile parameters: Pt, Pa, Fig; inclination parameters: Smx, Smn; Horizontal axis angle parameter: Tilt; Distance parameters between the optical axis and the contour: Xp, XV, Xt; Root mean square roughness parameter: RMS; Slope parameters: Slpe mx, Sjpermx (x), Sjperms, Slpe are; Vertex radius error parameter: Radius Err |
| Filter | Filter Types | Gaussian filter, 2RC filter, zero phase filter |
| Sampling | Sampling Length | 0.008, 0.08, 0.25, 0.8, 2.5, 8.0, 25mm selectable |
| Evaluation Length | Auto calculation | |
| Physical Specifications | Size (L×W×H) | 800×500×1080mm |
| Weight | 265kg |
Notes:
- *1 The accuracy is based on the measurement standard gauge block.
- *2 The accuracy is based on the Pt test of standard ball smaller than diameter 25mm.
- *3 The accuracy is based on the verification of the Φ 50mm standard ball with the arc exceeds 90 degrees.
- *4 The accuracy is based on the measurement of the angle of polygonal prism.
- *5 The accuracy is based on the measurement of optical flat.
- *6 The accuracy is based on the measurement of standard roughness block.
- *7 The repeatability is based on the measurement of 0.1-0.2μm square wave roughness block and standard step height block.
- *8 The accuracy is based on the measurement of 1nm level roughness block and optical flat.
Video
Chotest SJ5700 Series Profilometer
Introduction and Application of Profilometer SJ5700 Series
Chotest Profilometer for Optics Surface SJ5720-OPT200
Chotest Profilometer for Optics Surface SJ5720-OPT200
Contour & Roughness in one solution