MICROSCOPE
SuperView W1 – 3D Optical Surface Profilometer
White Light Interferometry | Nano 3D Surface Form & Roughness
The CHOTEST SuperView W1 is a state-of-the-art optical surface profiler designed for high-precision 3D surface analysis at the nanometric level. Using white light interferometry, it provides accurate, repeatable, and non-contact measurements of surface form, roughness, and step height — ideal for R&D and quality control in semiconductor, optics, micro-electronics, and materials industries.
SuperView
W3 – 3D Optical Surface Profilometer
Large-Scale 3D Optical Profilometer for Semiconductor and Precision Surface Analysis
The CHOTEST SuperView W3 is a high-end 3D optical surface profiler built for large-scale measurement applications.
Using white light interferometry, it measures 3D surface form and roughness with nanometric precision over large wafers and samples.
Designed for semiconductor manufacturing, it supports automatic wafer measurement up to 12 inches and delivers one-key operation for productivity and accuracy.
Discover more
SuperView WT Series – Hybrid 3D Optical Surface Profilometer
White Light Interferometry + Confocal Microscopy | Dual Technology for Nanometric Precision
The CHOTEST SuperView WT Series combines the power of white light interferometry and confocal microscopy in a single hybrid 3D optical profiler.
It enables non-contact, nanometric surface measurement for a wide range of materials — from super-smooth optical coatings to microstructured or rough industrial components.
By automatically switching between interferometry and confocal modes, the WT Series provides optimal imaging precision, versatility, and speed, making it ideal for advanced R&D, semiconductor production, and high-precision surface metrology.
SuperView WX100 – White Light Interferometry Probe
In-line Roughness and 3D Profile Inspection
The CHOTEST SuperView WX100 is a compact and high-precision white light interferometry probe designed for in-line surface roughness and 3D profile measurement.
It combines nanometric resolution, robust mechanical design, and flexible integration capabilities, making it ideal for industrial automation and high-end metrology systems.
Engineered for integration into production lines, automation systems, or multi-sensor coordinate platforms, the WX100 provides real-time surface measurement with non-contact accuracy and smart control.
Discover more
VT Series – Confocal Microscope
High-Precision 3D Surface Measurement | Rotating Disk Confocal Technology
The CHOTEST VT6000 Series is a high-precision confocal microscope system designed for micro and nano-level measurement of a wide range of precision components and material surfaces.
Thanks to its rotating confocal optical system and advanced 3D reconstruction algorithms, the VT6000 delivers high-accuracy, non-contact surface analysis — from ultra-smooth polished surfaces to rough and reflective materials.
The series includes multiple models (VT6100, VT6200, VT6300) to meet different measurement needs, from compact research setups to large-scale industrial inspection systems.