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Microscope Superview WX100

3D Optical Surface Profilometer
White Light Interferometry Probe| Nano 3D Surface Form & Roughness
In-line roughness and 3D profile inspection
WX100


Description Key Features Software: XtremeVision 3D Application Applications Cases Lens Spec General Spec Videos

SuperView WX100 – 3D Optical Surface Profilometer

White Light Interferometry | Nano 3D Surface Form & Roughness

The WX100 is a compact, stand-alone WLI probe designed for integration into production lines or custom measurement stations. It brings the power of nanoscale 3D profiling and roughness measurement directly to your manufacturing process for in-line inspection. Featuring motorized tilt and a comprehensive SDK, it is the perfect component for automating quality control and developing tailored metrology solutions.


Key Features


  • Measurement function: it can realize high precision Z scanning of sample surface and obtain 3D image.

  • Analysis function: It can obtain 2D and 3D data such as surface roughness, micro-nano-level contour size, etc.

  • Programming function: Support pre-configured data processing and analysis tool steps, one-click to complete the whole process from measurement to analysis.

  • Batch analysis: Data processing and analysis templates can be customized according to the customer demands, and one-click batch analysis can be realized for the same type of parameter data.

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Software: XtremeVision 3D

The integrated XtremeVision 3D software combines:

  • 3D image scanning & analysis

  • Automated measurement

  • Intelligent noise filtering

  • Hybrid scanning (white light interferometry + confocal)

It allows automatic feature recognition and step height measurement with repeatability as fine as 0.005μm and step accuracy of 0.08%.

The second-generation self-developed microscopic 3D measurement software integrates four modular functions: Image scanning, 3D analysis, Image measurement, and Automated measurement.

It can perfectly adapt to all microscopic 3D machine models of CHOTEST W series & VT series & WT series, and can independently identify the type of model. 
Especially, the software can automatically switch scanning modes between white light interferometry and confocal microscopy on 2-in-1 Hybrid 3D Optical Profilometer.

Xtremevision Pro has transplanted the successful experience of CHOTEST in the field of image flash measurement, which can automatically match and measure XY plane dimensions such as point-line distance, angle, radius, etc.

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Application

  • Semiconductor, polished silicon wafer, thin silicon wafer, wafer IC
  • 3C electronics, sapphire glass roughness, metal shell mold defects, glass screen height difference

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Application Cases

Measurement and analysis for various products, components and materials`surface form and profile characteristics, such as flatness, roughness, waviness, appearance, surface defect, abrasion, corrosion, gap,hole, stage, curvature, deformation, etc.

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Lens Specification



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Videos

Super WX100 AU full automation optical 3D profile measurement system



Super WX100 AU full automation optical 3D profile measurement system

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For other models and more details, please refer to our brochure Request for brochure