Microscope Superview WT series
Description Key Features Software: XtremeVision 3D Application Applications Cases Lens Spec General Spec Videos
SuperView W1 – 3D Optical Surface Profilometer
White Light Interferometry | Nano 3D Surface Form & Roughness
Experience ultimate versatility with the SuperView WT series, the only system that integrates both White Light Interferometry (WLI) and Confocal Microscopy in a single instrument. Seamlessly switch between WLI for flawless measurement of smooth/transparent surfaces and Confocal mode for challenging rough or high-slope surfaces. This all-in-one solution eliminates compromise, ensuring optimal precision across your entire range of samples and applications.
Key Features
High-Resolution 3D Measurement
Advanced white-light interferometry for ultra-precise topography and roughness mapping.
Multiple Interference Lenses
Interchangeable lenses (2.5× to 100×) for both smooth and coarse surface measurements.
Vacuum Object Table
Stable and vibration-free measurement for delicate wafers and micro-components.
Air-Bearing Isolation System
Built-in air suspension ensures vibration isolation for ultra-stable performance.
Smart Leveling & Vibration Isolation
Sonic vibration isolation and adjustable leveling system to enhance accuracy.
Ergonomic Joystick Control
Intuitive joystick for easy X/Y/Z movement and focus adjustment.
Software: XtremeVision 3D
The integrated XtremeVision 3D software combines:
3D image scanning & analysis
Automated measurement
Intelligent noise filtering
Hybrid scanning (white light interferometry + confocal)
It allows automatic feature recognition and step height measurement with repeatability as fine as 0.005μm and step accuracy of 0.08%.
point-line distance, angle, radius, etc.
Applications
micro-nano materials, micro-electro-mechanical system.
Application Cases
Measurement and analysis for various products, components and materials`surface form and profile characteristics, such as flatness, roughness, waviness, appearance, surface defect, abrasion, corrosion, gap,hole, stage, curvature, deformation, etc.
Lens Specification
Surface Profile measurement by Chotest 3D optical profilometer W1
The CHOTEST W1 nano-profilometer microscope is a high-precision instrument designed for surface measurement and analysis at the nanoscale. It utilizes advanced optical technology, including various magnification interference lenses and a vacuum object table, to ensure accurate and stable measurements, even on delicate or uneven surfaces. The system also incorporates features like an air-bearing isolation system and sonic vibration isolation to eliminate external interference, alongside a convenient joystick for precise control, making it ideal for applications in fields requiring detailed surface characterization.
Nano Surface Profile measurement by Chotest 3D - optical profilometer W1
General presentation
Metal Scraps surface roughness inspection by Chotest W1 Optical 3D Surface profilometer
Metal Scraps surface roughness inspection by Chotest W1 Optical 3D Surface profilometer